KHAN, M. S.; YASEER A. DURRANI. Thermal Macro-Modeling and Safe Operating Area Analysis of MOSFETs. International Journal of Innovations in Science & Technology, [S. l.], v. 7, n. 7, p. 397–406, 2025. Disponível em: https://journal.50sea.com/index.php/IJIST/article/view/1435. Acesso em: 3 aug. 2025.