Leveraging CIELAB Segmentation and CNN for Wheat Fungi Disease Classification
Keywords:
CNN, Wheat Fungi Diseases, Deep Learning, CIELAB Segmentation and Smart FarmingAbstract
Wheat is the third most harvested and consumed grain globally, but a significant portion of its production is wasted due to diseases. Fungal infections caused by pathogenic fungi are particularly harmful, greatly reducing crop yields. Manual visual inspection of large fields is slow, exhausting, and requires specialized expertise. This research introduces a novel combination of image augmentation, CIELAB segmentation, and a fine-tuned pre-trained CNN, achieving an unprecedented 98.43% accuracy in wheat fungal disease classification, addressing gaps in current detection methods and promoting sustainable agriculture. To conduct this research, datasets from Kaggle were merged and meticulously validated to create a comprehensive set with five classes: healthy wheat and four fungal diseases. Preprocessing steps included resizing, contrast enhancement and noise removal to ensure uniform and high-quality images followed by rigorous image augmentation techniques to expand and diversify the dataset ultimately enhancing the deep learning model's robustness and accuracy. The CNN model, trained over 80 epochs achieved an impressive 98.43% accuracy in classifying wheat fungal diseases. With a precision of 98.47% and an F1 score of 98.43% the model demonstrated strong positive classification accuracy. Additionally, a recall of 98.43% and specificity of 98.47% indicated its effectiveness in identifying true positive cases and accurately detecting disease presence or absence.
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